Researchers have tested eight stand-alone deep learning methods for PV cell fault detection and have found that their accuracy was as high as 73%. All methods were trained and tested on the ELPV ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

In today's rapidly evolving world, the transformative power of artificial intelligence (AI) is undeniable. Across various industries, AI has emerged as an indispensable tool, offering unparalleled ...