The study of lifetime distribution and reliability testing seeks to characterise the statistical behaviour of time-to-failure data for components and systems across a range of applications, from ...

When checking and verifying capacitors, inductors, diodes, bipolar transistors, and cables, the gamut of test methods can range from those used to confirm a defective component to identifying the ...

Collaboration enables SoC manufacturers to improve their qualification envelope to achieve lifetime reliability, shorten their root cause analysis time, and reduce operational costs HAIFA, ...

There are a number of complex tasks involved in the manufacturing of electronic assemblies, all of which can go wrong. In order to ensure quality standards are met, the fabrication of the printed ...

A newly drafted IEEE standard will bring more consistency to defect metrics in analog/mixed (AMS) designs, a long-overdue step that has become too difficult to ignore in the costly heterogeneous ...

The transition to the 2nm technology node introduces unprecedented challenges in Automated Test Equipment (ATE) bring-up and manufacturability. As semiconductor devices scale down, the complexity of ...

Immersion cooling is changing how designers address thermal issues in data centers. Formalizing standards and expanding testing capabilities are still needed to streamline component validation and ...