A newly drafted IEEE standard will bring more consistency to defect metrics in analog/mixed (AMS) designs, a long-overdue step that has become too difficult to ignore in the costly heterogeneous ...

Coverage has become a key technology in the pursuit of efficient and accurate verification of large designs. Obviously, simulation is still the cornerstone of verification, but the time when a single ...

Today’s consumers have come to expect more functionality from their electronic devices, provided in a smaller form factor. This has fueled the demand for integrated devices like smart phones, ...